Li X., Xiao L., Lin L., Xu X., Teng Y., Zhu Z., Dai S., Lin Y., Gao Z., Zhang D., Cao Z., ZHANG F., Song N., Zhang H., Liang X., Zhang Z., Zhou W.
Ключевые слова: HTS, Bi2223, tapes, cables, power equipment, dc performance, design parameters, jacketing, current leads, termination, cryogenic systems
Xiao L., Lin L., Xu X., Wang Z., Zhu Z., Dai S., Guo W., Gao Z., Zhang J., Zhang D., ZHANG F., Song N., Zhang Z., Qiu Q.
Ключевые слова: SMES, power equipment, HTS, coils pancake, helium liquid, conduction cooled systems, test long-term operation, design parameters, Bi2223, fabrication
Xiao L., Lin L., Zhu Z., Dai S., Zhang G., Guo W., Gao Z., Zhang J., Song N., Zhang Z., Qiu Q., Ren Q., Guoliu S.
Ключевые слова: SMES, power equipment, fluctuations, test results, control systems, HTS, Bi2223, tapes, coils pancake
Xiao L., Lin L., Xu X., Teng Y., Li H., Zhu Z., Dai S., Zhang G., Guo W., Gao Z., Zhang J., Zhang D., ZHANG F., Song N., Zhang Z., Qiu Q., Zhou W.
Ключевые слова: HTS, substation, power equipment, cables warm-dielectric, FCL inductive, transformers, design parameters, SMES
Ключевые слова: MgB2, bulk, doping effect, fabrication, sintering, milling process, microstructure, critical caracteristics, Jc/B curves
Li X., Xiao L., Lin L., Dai S., Zhang G., Ma Y., Gao Z., Zhang J., Zhang D., Wang D., Zhang Z., Xia D.
Ключевые слова: MgB2, wires monofilamentary, wires multifilamentary, coils, magnets, joints, model small-scale, test results, persistent current mode
Ключевые слова: HTS, YBCO, films, substrates, mechanical properties, stress effects, numerical analysis, distribution, temperature dependence, thermal properties, deformation
Ключевые слова: MgB2/Fe, tapes, doping effect, critical caracteristics, Jc/B curves, fabrication, microstructure, pinning force, experimental results
Ключевые слова: oxypnictides, fabrication, PIT process, sheath, wires, microstructure, critical caracteristics, Jc/B curves, doping effect, resistivity, temperature dependence
Ключевые слова: oxypnictides, tapes, texture, critical caracteristics, critical current density, PIT process, microstructure, fabrication, experimental results
© Copyright 2006-2012. Использование материалов сайта возможно только с обязательной ссылкой на сайт.
Свои замечания и пожелания вы можете направлять по адресу perst@isssph.kiae.ru
Техническая поддержка Alexey, дизайн Teodor.